Performance of Ge-on-Si p-i-n photodetectors for standard receiver modules

被引:70
|
作者
Morse, Mike [1 ]
Dosunmu, Olufemi
Sarid, Gadi
Chetrit, Yoel
机构
[1] Intel Corp, Santa Clara, CA 95054 USA
[2] Intel Corp, IL-91031 Jerusalem, Israel
关键词
germanium; photodectectors; receivers;
D O I
10.1109/LPT.2006.885623
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Ge on Si p-i-n photodetectors with areas which are compatible with commercially available receivers have been fabricated and tested. A dark current density of 6 mA/cm(2) at -1-V bias has been measured at room temperature; when heated to 85 degrees C, the measured dark current increases by a factor of nine. A responsivity of 0.59 A/W at 850 nm has been measured from these Ge detectors, which matches or exceeds commercially available GaAs devices. We have measured bandwidths approaching 9 GHz at -2-V bias from 50-mu m diameter Ge detectors, and have observed eye diagrams comparable to those obtained from GaAs-based receivers at 4.25 Gb/s.
引用
收藏
页码:2442 / 2444
页数:3
相关论文
共 50 条
  • [31] Receiver-less silicon-germanium avalanche p-i-n photodetectors
    Benedikovic, D.
    Virot, L.
    Aubin, G.
    Hartmann, J-M
    Amar, F.
    Le Roux, X.
    Alonso-Ramos, C.
    Cassan, E.
    Marris-Morini, D.
    Boeuf, F.
    Fedeli, J-M
    Kopp, C.
    Szelag, B.
    Vivien, L.
    2021 CONFERENCE ON LASERS AND ELECTRO-OPTICS EUROPE & EUROPEAN QUANTUM ELECTRONICS CONFERENCE (CLEO/EUROPE-EQEC), 2021,
  • [32] A model for the performance analysis and design of waveguide p-i-n photodetectors
    Das, NR
    Deen, MJ
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2005, 52 (04) : 465 - 472
  • [33] Photocurrent analysis of a fast Ge p-i-n detector on Si
    Oehme, M.
    Werner, J.
    Kasper, E.
    Klinger, S.
    Berroth, M.
    APPLIED PHYSICS LETTERS, 2007, 91 (05)
  • [34] Measurement and modelling of high performance lateral p-i-n photodetectors
    Giziewicz, W
    Choy, HKH
    Fonstad, CG
    Prasad, S
    MICROWAVE AND OPTICAL TECHNOLOGY 2003, 2003, 5445 : 114 - 119
  • [35] Admittance spectroscopy of Ge/Si p-i-n structures with Ge quantum dots
    Pishchagin, A. A.
    Voitsekhovskii, A. V.
    Kokhanenko, A. P.
    Serokhvostov, V. Yu
    Dzyadukh, S. M.
    Nikiforov, A. I.
    3RD INTERNATIONAL SCHOOL AND CONFERENCE ON OPTOELECTRONICS, PHOTONICS, ENGINEERING AND NANOSTRUCTURES (SAINT PETERSBURG OPEN 2016), 2016, 741
  • [36] Waveguide integrated Ge p-i-n photodetectors on a silicon-on-insulator platform
    Liu, J. F.
    Ahn, D.
    Hong, C. Y.
    Pan, D.
    Jongthammanurak, S.
    Beals, M.
    Kimerling, L. C.
    Michel, J.
    Pomerene, A. T.
    Hill, C.
    Jaso, M.
    Tu, K. Y.
    Chen, Y. K.
    Patel, S.
    Rasras, M.
    White, A.
    Gill, D. M.
    2006 Optics Valley of China International Symposium on Optoelectronics, 2006, : 1 - 4
  • [37] High bandwidth Ge p-i-n photodetector integrated on Si
    Oehme, M.
    Werner, J.
    Kasper, E.
    Jutzi, M.
    Berroth, M.
    APPLIED PHYSICS LETTERS, 2006, 89 (07)
  • [38] Noises of p-i-n UV photodetectors
    Gasparyan, Ferdinand V.
    Korman, Can E.
    Melkonyan, Slavik V.
    NOISE AND FLUCTUATIONS IN CIRCUITS, DEVICES, AND MATERIALS, 2007, 6600
  • [39] Nonlinearities in p-i-n microwave photodetectors
    Williams, KJ
    Esman, RD
    Dagenais, M
    JOURNAL OF LIGHTWAVE TECHNOLOGY, 1996, 14 (01) : 84 - 96
  • [40] Ge-on-insulator lateral p-i-n waveguide photodetectors for optical communication
    Cheng, Chin-Yuan
    Tsai, Cheng-Hsun
    Yeh, Po-Lun
    Hung, Sheng-Feng
    Bao, Shuyu
    Lee, Kwang Hong
    Tan, Chuan Seng
    Chang, Guo-En
    OPTICS LETTERS, 2020, 45 (24) : 6683 - 6686