Performance of Ge-on-Si p-i-n photodetectors for standard receiver modules

被引:70
|
作者
Morse, Mike [1 ]
Dosunmu, Olufemi
Sarid, Gadi
Chetrit, Yoel
机构
[1] Intel Corp, Santa Clara, CA 95054 USA
[2] Intel Corp, IL-91031 Jerusalem, Israel
关键词
germanium; photodectectors; receivers;
D O I
10.1109/LPT.2006.885623
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Ge on Si p-i-n photodetectors with areas which are compatible with commercially available receivers have been fabricated and tested. A dark current density of 6 mA/cm(2) at -1-V bias has been measured at room temperature; when heated to 85 degrees C, the measured dark current increases by a factor of nine. A responsivity of 0.59 A/W at 850 nm has been measured from these Ge detectors, which matches or exceeds commercially available GaAs devices. We have measured bandwidths approaching 9 GHz at -2-V bias from 50-mu m diameter Ge detectors, and have observed eye diagrams comparable to those obtained from GaAs-based receivers at 4.25 Gb/s.
引用
收藏
页码:2442 / 2444
页数:3
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