Electronic lifetime engineering using low-temperature GaAs in a quantum well structure

被引:0
|
作者
Stellmacher, M [1 ]
Berger, V [1 ]
Sirtori, C [1 ]
Nagle, J [1 ]
机构
[1] Thomson CSF, Cent Rech Lab, F-91404 Orsay, France
关键词
low temperature GaAs; defects isolation; lifetime engineering;
D O I
10.1016/S0022-0248(98)01322-0
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Using an AlAs barrier, it is possible to confine the defects associated to the low temperature grown GaAs in a well-defined portion of the sample. We verified that a minimum thickness of about 5 nm of AlAs is required. Structures with good quality QW and LT-GaAs QW have been grown where the separation between wells could be reduced to a minimum distance of 5 nm. This has been used to design quantum heterostructures where the extension of the electronic wave functions of the different levels over the LT-GaAs regions can be adjusted independently. This controlled overlap opens an alternative way to engineer the lifetime of various electronic subbands. (C) 1999 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:206 / 211
页数:6
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