RF Transient Pulse Signal Integrity with ns-Duration for Atom-Probe Tomography

被引：0

作者：

Zhao, L. ^{[1
,2
]}

Delamare, A. ^{[1
,2
]}

Normand, A. ^{[1
,2
]}

Delaroche, F. ^{[1
,2
]}

Latry, O. ^{[1
,2
]}

Vurpillot, F. ^{[1
,2
]}

Ravelo, B. ^{[3
]}

机构：

[1] Univ Rouen, GPM, UMR CNRS 6634, Normandy Univ, St Etienne, France

[2] INSA Rouen, St Etienne, France

[3] ESIGELEC, IRSEEM EA 4353, Grad Sch Engn, St Etienne, France

来源：

2015 IEEE RADIO AND ANTENNA DAYS OF THE INDIAN OCEAN (RADIO) | 2015年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Improvement of atom probe tomography requires the high voltage rectangular short pulses. This typical RF transient pulse must be applied on a sample inside an ultra-high vacuum (UHV) chamber. In this letter, we present a synthesis technique of rectangular pulse signal with full width ns-duration. The pulse signal was injected into the cryogenic analysis chamber through the transmitting system composed of a microstrip transmission line. The system frequency characterization based on the S-parameter analysis and RF engineering shows the transmitting system major deterrent. The preliminary experimental result demonstrates that the atom probe performance is improved.

引用

页数：2

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