RF Transient Pulse Signal Integrity with ns-Duration for Atom-Probe Tomography

被引:0
|
作者
Zhao, L. [1 ,2 ]
Delamare, A. [1 ,2 ]
Normand, A. [1 ,2 ]
Delaroche, F. [1 ,2 ]
Latry, O. [1 ,2 ]
Vurpillot, F. [1 ,2 ]
Ravelo, B. [3 ]
机构
[1] Univ Rouen, GPM, UMR CNRS 6634, Normandy Univ, St Etienne, France
[2] INSA Rouen, St Etienne, France
[3] ESIGELEC, IRSEEM EA 4353, Grad Sch Engn, St Etienne, France
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中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Improvement of atom probe tomography requires the high voltage rectangular short pulses. This typical RF transient pulse must be applied on a sample inside an ultra-high vacuum (UHV) chamber. In this letter, we present a synthesis technique of rectangular pulse signal with full width ns-duration. The pulse signal was injected into the cryogenic analysis chamber through the transmitting system composed of a microstrip transmission line. The system frequency characterization based on the S-parameter analysis and RF engineering shows the transmitting system major deterrent. The preliminary experimental result demonstrates that the atom probe performance is improved.
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