High-order birefringence and dispersion measurement using spectroscopic of polarized light

This paper describes a method and device for measurement of two-dimensional retardance and dispersion with high-order and azimuthal direction. The system consits of a white light source, crossed polarizers and a detector for spectroscopic polarized light. A spectroscopic interferogram shows sinusoidal to wave number change, and its period changes slightly because of dispersion of birefringence. Fourier transform method is used to analyze the birefringence from the spectroscopic interferogram. One hundred and twenty-eight sets of images are used for birefringence analysis. Some results of 2D birefringence distribution with dispersion are shown for the demonstration.