SUBJECTIVE MEASUREMENT OF HIGH-ORDER ABERRATIONS OF EYE

被引:62
|
作者
HOWLAND, B
HOWLAND, HC
机构
[1] MIT, ELECTR RES LAB, CAMBRIDGE, MA 02139 USA
[2] CORNELL UNIV, NEUROBIOL & BEHAV SECT, ITHACA, NY 14850 USA
关键词
D O I
10.1126/science.959814
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
引用
收藏
页码:580 / 582
页数:3
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