Phase-resolved terahertz near-field nanoscopy of a topological insulator phonon-polariton mode

被引：0

作者：

Giordano, M. C. ^{[1
,2
]}

Viti, L. ^{[1
,2
]}

Columbo, L. ^{[3
,4
,5
]}

Brambilla, M. ^{[3
,4
]}

Scamarcio, G. ^{[3
,4
]}

Vitiello, M. S. ^{[1
,2
]}

机构：

[1] CNR, Ist Nanosci, NEST, I-56127 Pisa, Italy

[2] Scuola Normale Super Pisa, I-56127 Pisa, Italy

[3] CNR, Ist Foton & Nanotecnol, I-70126 Bari, Italy

[4] Univ Bari, Dipartimento Interateneo Fis, I-70126 Bari, Italy

[5] Politecn Torino, Dipartimento Elettron & Telecomunicaz, I-10129 Turin, Italy

来源：

2018 43RD INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER, AND TERAHERTZ WAVES (IRMMW-THZ) | 2018年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A novel scattering-type near-field optical microscopy (s-SNOM) system based on a terahertz (THz) quantum cascade laser operating in self-detection mode is employed to probe a resonant phonon-polariton mode of a thin topological insulator flake (BizTe(2.2)Se(0.8)). Background-free near-field imaging with nanoscale spatial resolution is demonstrated.

引用

页数：2

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