Phase-resolved terahertz near-field nanoscopy of a topological insulator phonon-polariton mode

被引：0
|
作者：
Giordano, M. C. [1 ,2 ]
Viti, L. [1 ,2 ]
Columbo, L. [3 ,4 ,5 ]
Brambilla, M. [3 ,4 ]
Scamarcio, G. [3 ,4 ]
Vitiello, M. S. [1 ,2 ]
机构：
[1] CNR, Ist Nanosci, NEST, I-56127 Pisa, Italy
[2] Scuola Normale Super Pisa, I-56127 Pisa, Italy
[3] CNR, Ist Foton & Nanotecnol, I-70126 Bari, Italy
[4] Univ Bari, Dipartimento Interateneo Fis, I-70126 Bari, Italy
[5] Politecn Torino, Dipartimento Elettron & Telecomunicaz, I-10129 Turin, Italy
来源：
2018 43RD INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER, AND TERAHERTZ WAVES (IRMMW-THZ) | 2018年
关键词：
D O I：
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中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A novel scattering-type near-field optical microscopy (s-SNOM) system based on a terahertz (THz) quantum cascade laser operating in self-detection mode is employed to probe a resonant phonon-polariton mode of a thin topological insulator flake (BizTe(2.2)Se(0.8)). Background-free near-field imaging with nanoscale spatial resolution is demonstrated.
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页数：2
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