Electromagnetic Coupling between Power Distribution Network and On-chip Inductors in Package

被引:1
|
作者
Li, Bing-Heng [1 ]
Li, Yan [2 ]
Li, Er-Ping [1 ]
机构
[1] Zhejiang Univ, Coll Informat Sci & Elect Engn, Hangzhou 310027, Peoples R China
[2] China Jiliang Univ, Hangzhou 310018, Peoples R China
关键词
D O I
10.1109/PIERS55526.2022.9792784
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Electromagnetic interference (EMI) is a growing concern in integrated circuits as the operating frequency of electronic devices increases rapidly. In this paper, the electromagnetic coupling mechanism between the power distribution network (PDN) and on-chip inductors in the package is discussed. The full-wave simulation software CST is employed to obtain noise voltages. For the two inductors placed symmetrically, the amplitudes of two voltages with opposite polarity induced by the inductors are not equal, so there is a net voltage on the PDN. In order to reduce the noise voltage, two approaches have been proposed. Designing the PDN with dual supply voltages and dual grounds (DSDG) can reduce the noise voltage by 86.3%. And etching metal layer 1st under the inductors can reduce the noise voltage by 35.0% while etching metal layers 1st, 2nd can reduce the noise voltage by 72.9%.
引用
收藏
页码:125 / 128
页数:4
相关论文
共 50 条
  • [1] Electromagnetic Interactions of On-Chip Antennas and Inductors
    Deng, Tianwei
    Chen, Zhiming
    Zhang, Yueping
    2012 ASIA-PACIFIC MICROWAVE CONFERENCE (APMC 2012), 2012, : 331 - 333
  • [2] Coupling Effects Between On-Chip Inductors in the Millimeter-Wave Regime
    Kang, Kai
    Tan, Cher Jiun
    Brinkhoff, James
    Shi, Jinglin
    Lin, Fujiang
    IEEE ELECTRON DEVICE LETTERS, 2010, 31 (04) : 362 - 364
  • [3] Mutual coupling of on-chip inductors in CMOS technology
    Hsu, Heng-Ming
    Chang, Jeng-Zen
    JOURNAL OF MICROMECHANICS AND MICROENGINEERING, 2008, 18 (03)
  • [4] Experimental characterization of coupling effects between two on-chip neighboring square inductors
    Yin, WY
    Pan, SJ
    Li, LW
    Gan, YB
    IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, 2003, 45 (03) : 557 - 561
  • [5] Characterization of capacitive coupling for on-chip circular stacked inductors
    Liu, Xiao-Cha
    Liu, Ping
    INTERNATIONAL JOURNAL OF INFRARED AND MILLIMETER WAVES, 2006, 27 (01): : 81 - 92
  • [6] Characterization of capacitive coupling for on-chip circular stacked inductors
    Liu X.-C.
    Liu P.
    Int J Infrared Millim Waves, 2006, 1 (79-90): : 79 - 90
  • [7] Electromagnetic modeling of switching noise in on-chip power distribution networks
    Mao, JF
    Kim, WP
    Choi, S
    Swaminathan, M
    Libous, J
    O'Connor, D
    PROCEEDINGS OF THE 8TH INTERNATIONAL CONFERENCE ON ELECTROMAGNETIC INTERFERENCE AND COMPATIBILITY, 2003, : 47 - 52
  • [8] Methodology for IR Drop Analysis of On-Chip Power Distribution Network under Electromagnetic Pulse Attack
    Liu Q.
    Zhang P.
    Jisuanji Fuzhu Sheji Yu Tuxingxue Xuebao/Journal of Computer-Aided Design and Computer Graphics, 2024, 36 (04): : 582 - 590
  • [9] Comparison of compact on-chip inductors embedded in wafer-level package
    Itoi, K
    Sato, M
    Okada, K
    Masu, K
    Ito, T
    55TH ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE, VOLS 1 AND 2, 2005 PROCEEDINGS, 2005, : 1578 - 1583
  • [10] Frequency Domain Analysis of On-Chip Power Distribution Network
    Batra, S.
    Singh, P.
    Kaushik, S.
    Hashmi, M. S.
    2016 20TH INTERNATIONAL SYMPOSIUM ON VLSI DESIGN AND TEST (VDAT), 2016,