A magnetic force microscopy and Kerr effect study of magnetic domains and cross-tie walls in magnetoresistive NiFe shapes

被引：6
|
作者：
Joisten, H [1 ]
Lagnier, S
Vaudaine, MH
Vieux-Rochaz, L
Porteseil, JL
机构：
[1] CMI, STMC, DMITEC, LETI, F-38054 Grenoble 9, France
[2] CNRS, Lab Louis Neel, F-38042 Grenoble, France
来源：
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 2001年 / 233卷 / 03期
关键词：
magnetoresistive NiFe films; Kerr effect; magnetic force microscopy; domains; cross-tie walls;
D O I：
10.1016/S0304-8853(01)00059-2
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Magnetic domains were observed in 350 Angstrom NiFe films. Cross-tie domain walls and ripple structures were observed inside the domains by MFM. The perturbative effect of the standard CoCr MFM tip on the magnetic microstructure was brought to evidence. A demagnetized, low-coercivity Fe tip gave the best images. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：230 / 235
页数：6
相关论文
共 36 条
  • [31] Magnetic Force Microscopy Study of Zr2Co11-Based Nanocrystalline Materials: Effect of Mo Addition
    Yue, Lanping
    Jin, Yunlong
    Zhang, Wenyong
    Sellmyer, David J.
    JOURNAL OF NANOMATERIALS, 2015, 2015
  • [32] Magnetic force microscopy study on the effect of Cu in melt-spun Sm-Fe-Si-C ribbons
    Sun, ZG
    Zhang, HW
    Zhang, SY
    Han, BS
    Shen, BG
    JOURNAL OF APPLIED PHYSICS, 2000, 87 (04) : 2061 - 2063
  • [33] Study of NiFe/Al/Al2O3 magnetic tunnel junction interfaces using second-harmonic magneto-optic Kerr effect
    Russek, SE
    Crawford, TM
    Silva, TJ
    JOURNAL OF APPLIED PHYSICS, 1999, 85 (08) : 5273 - 5275
  • [34] Study of NiFe/Al/Al2O3 magnetic tunnel junction interfaces using second-harmonic magneto-optic Kerr effect
    Russek, S.E.
    Crawford, T.M.
    Silva, T.J.
    Journal of Applied Physics, 1999, 85 (8 II A) : 5273 - 5275
  • [35] Magneto-optical Kerr effect (MOKE) and magnetic force microscopy (MFM) studies on Cr/Ni nanodot arrays deposited using innovative nano-stencil method
    Pradhan, Sonali
    Satapathy, Srinibas
    Nayak, Maheswar
    Mohanty, Jyoti Ranjan
    Mishra, Saroj Kumar
    Majumder, Shovan Kumar
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2024, 35 (33)
  • [36] Magnetic force microscopy study of dense stripe domains in Fe-B/Co-Si-B multilayers and the evolution under an external applied field
    Asenjo, A
    García, D
    García, JM
    Prados, C
    Vázquez, M
    PHYSICAL REVIEW B, 2000, 62 (10): : 6538 - 6544
1234