A magnetic force microscopy and Kerr effect study of magnetic domains and cross-tie walls in magnetoresistive NiFe shapes

被引：6
|
作者：
Joisten, H [1 ]
Lagnier, S
Vaudaine, MH
Vieux-Rochaz, L
Porteseil, JL
机构：
[1] CMI, STMC, DMITEC, LETI, F-38054 Grenoble 9, France
[2] CNRS, Lab Louis Neel, F-38042 Grenoble, France
来源：
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 2001年 / 233卷 / 03期
关键词：
magnetoresistive NiFe films; Kerr effect; magnetic force microscopy; domains; cross-tie walls;
D O I：
10.1016/S0304-8853(01)00059-2
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Magnetic domains were observed in 350 Angstrom NiFe films. Cross-tie domain walls and ripple structures were observed inside the domains by MFM. The perturbative effect of the standard CoCr MFM tip on the magnetic microstructure was brought to evidence. A demagnetized, low-coercivity Fe tip gave the best images. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：230 / 235
页数：6
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