Microscopic Second-order Susceptibility Tensor Analysis

被引：0
|
作者：
Huttunen, Mikko J. [1 ]
Naskali, Liisa [1 ]
Virkki, Matti [1 ]
Bautista, Godofredo [1 ]
Der, Andras [2 ]
Kauranen, Martti [1 ]
机构：
[1] Tampere Univ Technol, Dept Phys, FI-33101 Tampere, Finland
[2] Hungarian Acad Sci, Biol Res Ctr, Inst Biophys, H-6701 Szeged, Hungary
来源：
2013 CONFERENCE ON LASERS AND ELECTRO-OPTICS EUROPE AND INTERNATIONAL QUANTUM ELECTRONICS CONFERENCE (CLEO EUROPE/IQEC) | 2013年
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中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
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页数：1
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