Microscopic Second-order Susceptibility Tensor Analysis

被引：0

作者：

Huttunen, Mikko J. ^{[1
]}

Naskali, Liisa ^{[1
]}

Virkki, Matti ^{[1
]}

Bautista, Godofredo ^{[1
]}

Der, Andras ^{[2
]}

Kauranen, Martti ^{[1
]}

机构：

[1] Tampere Univ Technol, Dept Phys, FI-33101 Tampere, Finland

[2] Hungarian Acad Sci, Biol Res Ctr, Inst Biophys, H-6701 Szeged, Hungary

来源：

2013 CONFERENCE ON LASERS AND ELECTRO-OPTICS EUROPE AND INTERNATIONAL QUANTUM ELECTRONICS CONFERENCE (CLEO EUROPE/IQEC) | 2013年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页数：1

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