Deposition of SiC/Si coatings in a microwave plasma-assisted spouted bed reactor

被引:8
|
作者
van Laar, J. H. [1 ,2 ]
Bissett, H. [1 ]
Barry, J. C. [1 ]
van der Walt, I. J. [1 ]
Crouse, P. L. [2 ]
机构
[1] South African Nucl Energy Corp SOC Ltd NECSA, Appl Chem Dept, Pelindaba, North West Prov, South Africa
[2] Univ Pretoria, Fac Engn Built Environm & Informat Technol, Dept Chem Engn, Fluoromat Grp, Pretoria, South Africa
基金
新加坡国家研究基金会;
关键词
Silicon carbide; Microwave plasma; Spouted bed; Methyltrichlorosilane; Particle coating; CHEMICAL-VAPOR-DEPOSITION; SILICON-CARBIDE; FLUIDIZED-BED; NANOPARTICLES; DIAMOND; LEVEL; FILMS; FUEL;
D O I
10.1016/j.jeurceramsoc.2017.10.030
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Silicon carbide (SiC) layers were deposited onto alumina particles in a microwave plasma-assisted spouted bed reactor using methyltrichlorosilane (MTS) and hydrogen mixtures, in argon, as precursor gas feed. The operating parameters studied were enthalpy, gas composition, and pressure. Microwaves were guided from a generator, operating at 2.45 GHz, along a rectangular waveguide intersecting a quartz tube, acting as the reaction zone. A graphite nozzle at the bottom of the tube facilitated the spouting action. Growth rates varied from 50 to 140 mu m/h. Overall results indicate that the optimal region for SiC deposition requires relatively high enthalpy (similar to 5 MJ/kg) and pressure ( > -60 kPa) conditions, with hydrogen-to-MTS ratios similar to 5:1. The quality (i.e. crystallinity, particle size, Si/C ratios) of the layers improve at these conditions, at the cost of decreased deposition rates. Characterisation was done by XRD, FTIR, XPS, SEM, TEM and EDX, which assisted in developing colour and morphological charts to indicate the changes as a function of changing operating parameters. A microwave plasma spouted bed reactor is demonstrated to be a viable alternative technique for SiC layer deposition onto microspheres.
引用
收藏
页码:1197 / 1209
页数:13
相关论文
共 50 条
  • [21] Effect of substrate bias on 3C-SiC deposition on Si by AC plasma-assisted CVD
    Shimizu, H.
    Shiga, M.
    Materials Science Forum, 1998, 264-268 (pt 1): : 211 - 214
  • [22] Development and combustion characteristics of microwave plasma-assisted fluidized bed combustor
    Yamamoto, Tsuyoshi
    Imamura, Yuichiro
    Kishida, Masahiro
    ADVANCED POWDER TECHNOLOGY, 2023, 34 (10)
  • [23] Novel microwave plasma-assisted CVD reactor for diamond delta doping
    Vikharev, A. L.
    Gorbachev, A. M.
    Lobaev, M. A.
    Muchnikov, A. B.
    Radishev, D. B.
    Isaev, V. A.
    Chernov, V. V.
    Bogdanov, S. A.
    Drozdov, M. N.
    Butler, J. E.
    PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, 2016, 10 (04): : 324 - 327
  • [24] PLASMA-ASSISTED CHEMICAL VAPOR-DEPOSITION OF TIN OXIDE COATINGS
    INAL, OT
    BENGISU, M
    GUARDIAN, J
    JOURNAL OF MATERIALS SCIENCE, 1993, 28 (05) : 1155 - 1160
  • [25] PLASMA-ASSISTED CHEMICAL VAPOR-DEPOSITION OF CERAMIC FILMS AND COATINGS
    DAVIS, RF
    PROCESSING SCIENCE OF ADVANCED CERAMICS, 1989, 155 : 213 - 225
  • [26] DEPOSITION OF DENSE AND HARD COATINGS BY ION-ASSISTED AND PLASMA-ASSISTED VACUUM PROCESSES
    GUENTHER, KH
    PLATING AND SURFACE FINISHING, 1991, 78 (06): : 30 - &
  • [27] MICROWAVE PLASMA-ASSISTED DEPOSITION OF BORON DOPED SINGLE CRYSTAL DIAMOND
    Grotjohn, Timothy A.
    Bhattacharya, Ayan
    Zajac, Steven
    2016 43RD IEEE INTERNATIONAL CONFERENCE ON PLASMA SCIENCE (ICOPS), 2016,
  • [28] Methyl concentration measurements during microwave plasma-assisted diamond deposition
    Cappelli, MA
    Owano, TG
    Gicquel, A
    Duten, X
    PLASMA CHEMISTRY AND PLASMA PROCESSING, 2000, 20 (01) : 1 - 12
  • [29] Methyl Concentration Measurements During Microwave Plasma-Assisted Diamond Deposition
    M. A. Cappelli
    T. G. Owano
    A. Gicquel
    X. Duten
    Plasma Chemistry and Plasma Processing, 2000, 20 : 1 - 12
  • [30] PLASMA-ASSISTED CHEMICAL-VAPOR-DEPOSITION IN A TUNABLE MICROWAVE CAVITY
    SALVADORI, MC
    MAMMANA, VP
    MARTINS, OG
    DEGASPERI, FT
    PLASMA SOURCES SCIENCE & TECHNOLOGY, 1995, 4 (03): : 489 - 494