Novel 600-V trench high-conductivity IGBT (trench HiGT) with short-circuit capability

被引:32
|
作者
Oyama, K [1 ]
Kohno, Y [1 ]
Sakano, J [1 ]
Uruno, J [1 ]
Ishizaka, K [1 ]
Kawase, D [1 ]
Mori, M [1 ]
机构
[1] Hitachi Ltd, Hitachi Res Lab, Hitachi, Ibaraki 3191292, Japan
关键词
D O I
10.1109/ISPSD.2001.934642
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper describes new 600-V trench high-conductivity IGBTs (trench HiGTs) that have lower on-state voltages of 1.42 and 1.55 V at 200 A/cm(2) and tough short-circuit capabilities of 5 and 10 mus, respectively. These HiGT have a better trade-off between turn-off losses and on-state voltages than conventional trench IGBTs, even better than planar IGBTs. They also offer a lower reverse transfer capacitances (-50%) than the planar IGBT. The input capacitance obtained were lower (-30% to -60%) than that of a conventional trench IGBT.
引用
收藏
页码:417 / 420
页数:4
相关论文
共 49 条
  • [21] SiC Trench MOSFET with Depletion-Mode pMOS for Enhanced Short-Circuit Capability and Switching Performance
    Yu, Hengyu
    Shi, Limeng
    Bhattacharya, Monikuntala
    Jin, Michael
    Qian, Jiashu
    Agarwal, Anant K.
    ELECTRONICS, 2023, 12 (23)
  • [22] Investigation of mechanical stress effect on electrical behavior of Trench Punch Through IGBT under short-circuit condition at low and high temperature
    Azzopardi, S.
    El Boubkari, K.
    Belmehdi, Y.
    Deletage, J. Y.
    Woirgard, E.
    PROCEEDINGS OF THE 2011-14TH EUROPEAN CONFERENCE ON POWER ELECTRONICS AND APPLICATIONS (EPE 2011), 2011,
  • [23] A Novel High-Speed Split-Gate Trench Carrier-Stored Trench-Gate Bipolar Transistor with Enhanced Short-Circuit Roughness
    Qian, Zhehong
    Cui, Wenrong
    Feng, Tianyang
    Xu, Hang
    Yang, Yafen
    Sun, Qingqing
    Zhang, David Wei
    MICROMACHINES, 2024, 15 (06)
  • [24] Investigation on the short-circuit capabihity of 1200V trench gate field-stop IGBTs
    Otsuki, M
    Onozawa, Y
    Kirisawa, M
    Kanemaru, H
    Yoshihara, K
    Seki, Y
    PROCEEDINGS OF THE 14TH INTERNATIONAL SYMPOSIUM ON POWER SEMICONDUCTOR DEVICES & ICS, 2002, : 281 - 284
  • [25] Single Pulse Short-Circuit Failure Mechanism of 1200V Asymmetric Trench SiC MOSFETs
    Wei, Zhaoxiang
    Wei, Jiaxing
    Yan, Xiaowen
    Zhou, Hua
    Fu, Hao
    Liu, Siyang
    Sun, Weifeng
    2021 IEEE WORKSHOP ON WIDE BANDGAP POWER DEVICES AND APPLICATIONS IN ASIA (WIPDA ASIA 2021), 2021, : 213 - 216
  • [26] INSTANTANEOUS CIRCUIT-BREAKER SETTINGS FOR THE SHORT-CIRCUIT PROTECTION OF DIRECT-CURRENT 300-V AND 600-V TRAILING CABLES
    VILCHECK, WS
    FESAK, G
    HELFRICH, WJ
    IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS, 1981, 17 (04) : 362 - 368
  • [27] Robustness improvement of short-circuit capability by SiC trench-etched double-diffused MOS (TED MOS)
    Tega, Naoki
    Tani, Kazuki
    Hisamoto, Digh
    Shima, Akio
    PRODCEEDINGS OF THE 2018 IEEE 30TH INTERNATIONAL SYMPOSIUM ON POWER SEMICONDUCTOR DEVICES AND ICS (ISPSD), 2018, : 439 - 442
  • [28] The 600V rating n-ch trench IGBT with the low leakage current and the high channel mobility using the (010) oriented trench sidewall
    Kim, HS
    Lee, TS
    Kim, HC
    Choi, YC
    Im, PG
    Kim, DJ
    ISPSD '97: 1997 IEEE INTERNATIONAL SYMPOSIUM ON POWER SEMICONDUCTOR DEVICES AND ICS, 1997, : 265 - 268
  • [29] A 600V 200A low loss high current density trench IGBT for hybrid vehicles
    Hamada, K
    Kushida, T
    Kawahashi, A
    Ishiko, M
    ISPSD'01: PROCEEDINGS OF THE 13TH INTERNATIONAL SYMPOSIUM ON POWER SEMICONDUCTOR DEVICES & ICS, 2001, : 449 - 452
  • [30] 1200-V Trench-FS IGBT: Process-Based Modeling and Short-Circuit Safe Operating Area (SCSOA) Optimization With the TOPSIS Method
    Chang, Yifei
    Wang, Jiaxuan
    Guan, Hao
    Liu, Pan
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2024, 71 (12) : 7716 - 7726