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Simulation and inference for stochastic volatility models driven by Levy processes
被引:18
|作者:
Gander, Matthew P. S.
[1
]
Stephens, David A.
机构:
[1] Univ London Imperial Coll Sci Technol & Med, Dept Math, London SW7 2AZ, England
[2] McGill Univ, Dept Math & Stat, Montreal, PQ H3A 2K6, Canada
来源:
关键词:
fractional;
long-memory;
ornstein-uhlenbeck process;
power decay process;
volatility;
D O I:
10.1093/biomet/asm048
中图分类号:
Q [生物科学];
学科分类号:
07 ;
0710 ;
09 ;
摘要:
We study Ornstein-Uhlenbeck stochastic processes driven by Levy processes, and extend them to more general non-Ornstein-Uhlenbeck models. In particular, we investigate the means of making the correlation structure in the volatility process more flexible. For one model, we implement a method for introducing quasi long-memory into the volatility model. We demonstrate that the models can be fitted to real share price returns data.
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页码:627 / 646
页数:20
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