Compendium of total ionizing dose results and displacement damage results for candidate spacecraft electronics for NASA

被引：0

作者：

Cochran, Donna J. ^{[1
]}

Kniffin, Scott D. ^{[1
]}

Buchner, Stephen P.

LaBel, Kenneth A. ^{[2
]}

O'Bryan, Martha V. ^{[1
]}

Ladbury, Raymond L. ^{[2
]}

Sanders, Anthony B. ^{[2
]}

Hawkins, Donald K. ^{[2
]}

Cox, Stephen R. ^{[2
]}

Poivey, Christian F. ^{[1
]}

Oldham, Timothy R.

Kim, Hak ^{[1
]}

Irwin, Tim L. ^{[1
]}

Friendlich, Mark R. ^{[1
]}

Dung-Phan, Anthony M. ^{[1
]}

Carts, Martin A. ^{[1
]}

Berg, Melanie D. ^{[1
]}

Seidleck, Christina M. ^{[1
]}

Forney, James D. ^{[1
]}

机构：

[1] NASA, Goddard Space Flight Ctr, MEI Technol Inc, Code 561-4,Bldg 22,Rm 062A, Greenbelt, MD 20771 USA

[2] NASA, Goddard Space Flight Ctr, Greenbelt, MD 20771 USA

来源：

NSREC: 2006 IEEE RADIATION EFFECTS DATA WORKSHOP, WORKSHOP RECORD | 2006年

关键词：

displacement damage; optoelectronics; proton damage; total ionizing dose; and single event effects;

D O I：

暂无

中图分类号：

TL [原子能技术]; O571 [原子核物理学];

学科分类号：

0827 ; 082701 ;

摘要：

Vulnerability of a variety of candidate spacecraft electronics to total ionizing dose and displacement damage is studied. Devices tested include optoelectronics, digital, analog, linear bipolar devices, and hybrid devices.

引用

页码：6 / +

页数：2

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