Compendium of total ionizing dose results and displacement damage results for candidate spacecraft electronics for NASA

被引：0
|
作者：
Cochran, Donna J. [1 ]
Kniffin, Scott D. [1 ]
Buchner, Stephen P.
LaBel, Kenneth A. [2 ]
O'Bryan, Martha V. [1 ]
Ladbury, Raymond L. [2 ]
Sanders, Anthony B. [2 ]
Hawkins, Donald K. [2 ]
Cox, Stephen R. [2 ]
Poivey, Christian F. [1 ]
Oldham, Timothy R.
Kim, Hak [1 ]
Irwin, Tim L. [1 ]
Friendlich, Mark R. [1 ]
Dung-Phan, Anthony M. [1 ]
Carts, Martin A. [1 ]
Berg, Melanie D. [1 ]
Seidleck, Christina M. [1 ]
Forney, James D. [1 ]
机构：
[1] NASA, Goddard Space Flight Ctr, MEI Technol Inc, Code 561-4,Bldg 22,Rm 062A, Greenbelt, MD 20771 USA
[2] NASA, Goddard Space Flight Ctr, Greenbelt, MD 20771 USA
来源：
NSREC: 2006 IEEE RADIATION EFFECTS DATA WORKSHOP, WORKSHOP RECORD | 2006年
关键词：
displacement damage; optoelectronics; proton damage; total ionizing dose; and single event effects;
D O I：
暂无
中图分类号：
TL [原子能技术]; O571 [原子核物理学];
学科分类号：
0827 ; 082701 ;
摘要：
Vulnerability of a variety of candidate spacecraft electronics to total ionizing dose and displacement damage is studied. Devices tested include optoelectronics, digital, analog, linear bipolar devices, and hybrid devices.
引用
收藏
页码：6 / +
页数：2
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