A systematic error model of high-resolution pipelined analog-to-digital converters

被引：0
|
作者：
Chen, Tingqian [1 ]
Yao, Bingkun [1 ]
Xu, Jun [1 ]
Ren, Junyan [1 ]
机构：
[1] Fudan Univ, Dept Microelect, ASIC & Syst State Key Lab, Shanghai 200433, Peoples R China
来源：
IEEE MWSCAS'06: PROCEEDINGS OF THE 2006 49TH MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOL II | 2006年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This work presents a systematic error model of high-resolution pipelined analog-to-digital converters (ADCs) implemented in MATLAB. Many errors limit linearity or noise performance of high-resolution ADCs, such as sampling distortion, slew-rate (SR) limiting, closed-loop gain variation of amplifiers, capacitor mismatch, clock jitter and thermal noise. All errors mentioned above are analyzed and modeled in a set of explicit mathematic expressions. Simulation results based on this model are compared with measured results of a 10-bit prototype ADC.
引用
收藏
页码：158 / +
页数：2
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