Calculation of the Johann error for spherically bent x-ray imaging crystal spectrometers

被引:17
|
作者
Wang, E. [1 ]
Beiersdorfer, P. [1 ]
Gu, M. [1 ]
Bitter, M. [2 ]
Delgado-Aparicio, L. [2 ]
Hill, K. W. [2 ]
Reinke, M. [3 ]
Rice, J. E. [3 ]
Podpaly, Y. [3 ]
机构
[1] Lawrence Livermore Natl Lab, Livermore, CA 94550 USA
[2] Princeton Plasma Phys Lab, Princeton, NJ 08543 USA
[3] MIT, Ctr Plasma Fus, Cambridge, MA 02139 USA
来源
REVIEW OF SCIENTIFIC INSTRUMENTS | 2010年 / 81卷 / 10期
关键词
D O I
10.1063/1.3491195
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
New x-ray imaging crystal spectrometers, currently operating on Alcator C-Mod, NSTX, EAST, and KSTAR, record spectral lines of highly charged ions, such as Ar(16+), from multiple sightlines to obtain profiles of ion temperature and of toroidal plasma rotation velocity from Doppler measurements. In the present work, we describe a new data analysis routine, which accounts for the specific geometry of the sightlines of a curved-crystal spectrometer and includes corrections for the Johann error to facilitate the tomographic inversion. Such corrections are important to distinguish velocity induced Doppler shifts from instrumental line shifts caused by the Johann error. The importance of this correction is demonstrated using data from Alcator C-Mod. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3491195]
引用
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页数:3
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