Calculation of the Johann error for spherically bent x-ray imaging crystal spectrometers

被引:17
|
作者
Wang, E. [1 ]
Beiersdorfer, P. [1 ]
Gu, M. [1 ]
Bitter, M. [2 ]
Delgado-Aparicio, L. [2 ]
Hill, K. W. [2 ]
Reinke, M. [3 ]
Rice, J. E. [3 ]
Podpaly, Y. [3 ]
机构
[1] Lawrence Livermore Natl Lab, Livermore, CA 94550 USA
[2] Princeton Plasma Phys Lab, Princeton, NJ 08543 USA
[3] MIT, Ctr Plasma Fus, Cambridge, MA 02139 USA
来源
REVIEW OF SCIENTIFIC INSTRUMENTS | 2010年 / 81卷 / 10期
关键词
D O I
10.1063/1.3491195
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
New x-ray imaging crystal spectrometers, currently operating on Alcator C-Mod, NSTX, EAST, and KSTAR, record spectral lines of highly charged ions, such as Ar(16+), from multiple sightlines to obtain profiles of ion temperature and of toroidal plasma rotation velocity from Doppler measurements. In the present work, we describe a new data analysis routine, which accounts for the specific geometry of the sightlines of a curved-crystal spectrometer and includes corrections for the Johann error to facilitate the tomographic inversion. Such corrections are important to distinguish velocity induced Doppler shifts from instrumental line shifts caused by the Johann error. The importance of this correction is demonstrated using data from Alcator C-Mod. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3491195]
引用
收藏
页数:3
相关论文
共 50 条
  • [21] Hard x-ray imaging using free-standing spherically bent crystals
    Faenov, AY
    Pikuz, TA
    Avrutin, V
    Izyumskaya, N
    Shabelnikov, L
    Shulakov, E
    Kyrala, GA
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2003, 74 (03): : 2224 - 2227
  • [22] Characterization of a spherically bent quartz crystal for Kα x-ray imaging of laser plasmas using a focusing monochromator geometry
    Kugland, N. L.
    Constantin, C. G.
    Doeppner, T.
    Neumayer, P.
    Glenzer, S. H.
    Niemann, C.
    JOURNAL OF INSTRUMENTATION, 2011, 6
  • [23] Double-spherically bent crystal scheme of stigmatic x ray monochromatic backlit imaging
    Wang, Ruirong
    An, Honghai
    Xie, Zhiyong
    Fang, Zhiheng
    Wang, W. E., I
    OPTICS LETTERS, 2022, 47 (21) : 5469 - 5472
  • [24] A spectral resolution of Johann-type X-ray spectrometers
    Stepanenko, M.
    PLASMA DEVICES AND OPERATIONS, 2009, 17 (03): : 191 - 200
  • [25] Imaging x-ray crystal spectrometers for the National Spherical Torus Experiment
    Bitter, M.
    Hill, K.W.
    Roquemore, A.L.
    Beiersdorfer, P.
    Kahn, S.M.
    Elliott, S.R.
    Fraenkel, B.
    Review of Scientific Instruments, 1999, 70 (1 II): : 292 - 295
  • [26] Imaging x-ray crystal spectrometers for the National Spherical Torus Experiment
    Bitter, M
    Hill, KW
    Roquemore, AL
    Beiersdorfer, P
    Kahn, SM
    Elliott, SR
    Fraenkel, B
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1999, 70 (01): : 292 - 295
  • [27] A BENT CRYSTAL X-RAY SPECTROGRAPH
    DEODHAR, GB
    KARNATAK, RC
    JOURNAL OF SCIENTIFIC INSTRUMENTS, 1957, 34 (01): : 21 - 23
  • [28] Bent crystal X-ray optics
    Förster, E.
    Guangxue Jingmi Gongcheng/Optics and Precision Engineering, 2007, 15 (12): : 1823 - 1828
  • [29] BENT CRYSTAL X-RAY MONOCHROMATORS
    WARREN, BE
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1950, 21 (01): : 102 - 102
  • [30] BENT CRYSTAL X-RAY SPECTROGRAPH
    BOSTER, TA
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1971, 16 (04): : 546 - &