Calculation of the Johann error for spherically bent x-ray imaging crystal spectrometers

被引:17
|
作者
Wang, E. [1 ]
Beiersdorfer, P. [1 ]
Gu, M. [1 ]
Bitter, M. [2 ]
Delgado-Aparicio, L. [2 ]
Hill, K. W. [2 ]
Reinke, M. [3 ]
Rice, J. E. [3 ]
Podpaly, Y. [3 ]
机构
[1] Lawrence Livermore Natl Lab, Livermore, CA 94550 USA
[2] Princeton Plasma Phys Lab, Princeton, NJ 08543 USA
[3] MIT, Ctr Plasma Fus, Cambridge, MA 02139 USA
来源
REVIEW OF SCIENTIFIC INSTRUMENTS | 2010年 / 81卷 / 10期
关键词
D O I
10.1063/1.3491195
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
New x-ray imaging crystal spectrometers, currently operating on Alcator C-Mod, NSTX, EAST, and KSTAR, record spectral lines of highly charged ions, such as Ar(16+), from multiple sightlines to obtain profiles of ion temperature and of toroidal plasma rotation velocity from Doppler measurements. In the present work, we describe a new data analysis routine, which accounts for the specific geometry of the sightlines of a curved-crystal spectrometer and includes corrections for the Johann error to facilitate the tomographic inversion. Such corrections are important to distinguish velocity induced Doppler shifts from instrumental line shifts caused by the Johann error. The importance of this correction is demonstrated using data from Alcator C-Mod. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3491195]
引用
收藏
页数:3
相关论文
共 50 条
  • [1] Hard X-Ray Transmission Imaging with Spherically Bent Crystal
    Shi Jun
    Zhao Yuxin
    Li Miao
    Wang Feng
    Yang Guohong
    Wei Minxi
    ACTA OPTICA SINICA, 2022, 42 (11)
  • [2] Hard X-Ray Transmission Imaging with Spherically Bent Crystal
    Shi J.
    Zhao Y.
    Li M.
    Wang F.
    Yang G.
    Wei M.
    Guangxue Xuebao/Acta Optica Sinica, 2022, 42 (11):
  • [3] X-ray imaging diagnosis for plasma by spherically bent crystal
    School of Physics and Electronics Science, Shanxi Datong University, Datong, China
    不详
    Guangdianzi Jiguang, 10 (1980-1983):
  • [4] Spherically bent crystal for X-ray imaging of laser produced plasmas
    Morace, A.
    Batani, D.
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2010, 623 (02): : 797 - 800
  • [5] A spherically bent crystal analyzer for X-ray backlighting imaging diagnosis
    Liu, Li-Feng
    Xiao, Sha-Li
    Qian, Jia-Yu
    Guangdianzi Jiguang/Journal of Optoelectronics Laser, 2015, 26 (03): : 439 - 443
  • [6] Application of spherically bent crystal to X-ray backlight imaging experiment
    Liu L.-F.
    Xiao S.-L.
    Wu Y.-F.
    Qian J.-Y.
    Wei M.-X.
    Chen B.-L.
    Guangxue Jingmi Gongcheng/Optics and Precision Engineering, 2011, 19 (09): : 2023 - 2028
  • [7] Accurate X-ray source dimension measurement by the spherically bent crystal imaging system
    Shen, Jin
    Zhang, Weiquan
    Zan, Guibin
    Xu, Zhanglang
    Du, Xuewei
    Wang, Qiuping
    ELEVENTH INTERNATIONAL CONFERENCE ON INFORMATION OPTICS AND PHOTONICS (CIOP 2019), 2019, 11209
  • [8] Imaging x-ray crystal spectrometers for KSTAR
    Lee, SG
    Bak, JG
    Bitter, M
    Moon, MK
    Nam, UW
    Jin, KC
    Kong, KN
    Seon, KI
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2003, 74 (03): : 1997 - 2000
  • [9] The spherical X-ray wave focusing by a bent crystal in the johann scheme
    Tchen, T
    TECHNICAL PHYSICS LETTERS, 2001, 27 (11) : 889 - 890
  • [10] The spherical X-ray wave focusing by a bent crystal in the Johann scheme
    T. Tchen
    Technical Physics Letters, 2001, 27 : 889 - 890