Structural and magnetic properties of antiperovskite Mn3NiNx thin films

被引:1
|
作者
Na, Yuanyuan [1 ]
Wang, Cong [2 ]
Xiang, Jinzhong [1 ]
机构
[1] Yunnan Univ, Dept Mat Sci & Engn, Sch Phys Sci & Technol, Kunming 650091, Peoples R China
[2] Beihang Univ, Dept Phys, Ctr Condensed Matter & Mat Phys, Beijing 100191, Peoples R China
基金
中国国家自然科学基金;
关键词
Thin Films; Sputtering; Structural; Magnetic materials; TIN FILMS; TEMPERATURE; DEPOSITION; SUBSTRATE;
D O I
10.1016/j.matlet.2015.03.095
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Influence of nitrogen fractions[N-f=N-2/(N-2+Ar-2)] on the structural and magnetic properties of Mn3NiNx thin films prepared on quartz substrates using magnetron sputtering have been studied. The N/Ni ratio increased (N/Ni=0.3-1.1) while the peak (200) shifted to lower angles with increasing N-f. It revealed that there was significant variation in the preferred orientation and Neel temperature (T-N) for the films with increasing N-f. Strong indication for a frozen state is found, determined from the difference between field-cooled and zero-field-cooled magnetizations. The ac susceptibility measurements show a peak position shifting as a function of the driving frequencyf and magnetization value does not saturate in the field range. These findings consistently demonstrate that Mn3NiNx thin films exhibit a spin-glass state at low temperature. (C) 2015 Elsevier B.V. All rights reserved.
引用
收藏
页码:213 / 216
页数:4
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