Orientation dependence of secondary recrystallisation in silicon-iron observations and analysis

A strong dependence on matrix texture was demonstrated for Goss secondary recrystallisation in 3 % silicon iron. Preferential consumption of grains having relationships of type Sigma 9 to Goss orientation was determined by EBSP measurement and discussed based on the assumption of low energy CSL boundaries, which experience a reduced Zener pinning force from particles.