共 50 条
- [41] Percolation model for the current oscillation in the Si-hf system PROCEEDINGS OF THE SYMPOSIUM ON ADVANCES IN MATHEMATICAL MODELING AND SIMULATION OF ELECTROCHEMICAL PROCESSES AND OXYGEN DEPOLARIZED CATHODES AND ACTIVATED CATHODES FOR CHLOR-ALKALI AND CHLORATED PROCESSES, 1998, 98 (10): : 148 - 157
- [44] Optical study of Si nanocrystals in Si/SiO2 layers by spectroscopic ellipsometry NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2004, 216 : 167 - 172
- [45] X-RAY INVESTIGATION OF HF-SI SYSTEM FROM 37 TO 65 AT PERCENT SI RUSSIAN METALLURGY-METALLY-USSR, 1969, (03): : 128 - +
- [47] HF-TREATED (111), (110) AND (100)SI SURFACES STUDIED BY SPECTROSCOPIC ELLIPSOMETRY JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1993, 32 (08): : 3572 - 3576
- [48] HF-treated (111), (110) and (100) Si surface studied by spectroscopic ellipsometry Utani, Katsuyuki, 1600, (32):
- [50] A systematic spectroscopic study of the FePc-Si interfaces PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, 2012, 44 (7-8): : 1572 - 1579