X-RAY INVESTIGATION OF HF-SI SYSTEM FROM 37 TO 65 AT PERCENT SI

被引：0
|
作者：
KARPINSKY, OG
EVSEYEV
机构：
来源：
RUSSIAN METALLURGY-METALLY-USSR | 1969年 / 03期
关键词：
D O I：
暂无
中图分类号：
TF [冶金工业];
学科分类号：
0806 ;
摘要：
引用
收藏
页码：128 / +
页数：1
相关论文
共 50 条
  • [1] THERMOCHEMISTRY OF SYSTEM HF-SI
    GOLUTVIN, YM
    MASLENNI.EG
    RUSSIAN METALLURGY-METALLY-USSR, 1971, (01): : 118 - &
  • [2] X-ray investigation of the Gd-Zn-Si system
    Demchenko, P
    Bodak, O
    Muratova, L
    JOURNAL OF ALLOYS AND COMPOUNDS, 2002, 346 (1-2) : 170 - 175
  • [3] Evaluation of Phase Equilibria Involving the Liquid Phase in the Hf-Si System
    Gigolotti, J. C. J.
    Nunes, C. A.
    Suzuki, P. A.
    Coelho, G. C.
    JOURNAL OF PHASE EQUILIBRIA AND DIFFUSION, 2014, 35 (05) : 622 - 630
  • [4] The X-ray investigation of the ternary Nd-Ag-Si system
    Zaplatynsky, OV
    Prots, YM
    Salamakha, PS
    Muratova, LO
    Bodak, OI
    JOURNAL OF ALLOYS AND COMPOUNDS, 1996, 232 (1-2) : L1 - L4
  • [5] Evaluation of Phase Equilibria Involving the Liquid Phase in the Hf-Si System
    J. C. J. Gigolotti
    C. A. Nunes
    P. A. Suzuki
    G. C. Coelho
    Journal of Phase Equilibria and Diffusion, 2014, 35 : 622 - 630
  • [6] Mechanical and Thermal Properties of the Hf-Si System: First-Principles Calculations
    Huang, Panxin
    Han, Guifang
    Liu, Huan
    Zhang, Weibin
    Peng, Kexue
    Li, Jianzhang
    Wang, Weili
    Zhang, Jingde
    JOURNAL OF COMPOSITES SCIENCE, 2024, 8 (04):
  • [7] X-ray Investigation of the Ce-Si-Sn System at 670 K
    Pol J Chem, 5 (959):
  • [8] X-ray investigation of the Ce-Si-Sn system at 670 K
    Stetskiv, AO
    Pavlyuk, VV
    Bodak, OI
    POLISH JOURNAL OF CHEMISTRY, 1998, 72 (05) : 959 - 961
  • [9] Mechanical properties and electronic structures of the Hf-Si system: First-principles calculations
    Liu, Qi-Jun
    Tian, Hao
    Liu, Zheng-Tang
    SOLID STATE COMMUNICATIONS, 2015, 205 : 39 - 45
  • [10] X-ray interference topography investigation of Si/GexSi1-x/Si(001) heterosystem
    Fedorov, AA
    Trukhanov, EM
    Vasilenko, AP
    Kolesnikov, AV
    Revenko, MA
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2003, 36 (10A) : A44 - A48
12345