Detection & Diagnostics in Today's Advanced Technology Nodes

被引：0
|
作者：
Zorian, Yervant [1 ]
机构：
[1] Synopsys, Sunnyvale, CA 94085 USA
来源：
PROCEEDINGS OF THE 2014 IEEE 17TH INTERNATIONAL SYMPOSIUM ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS & SYSTEMS (DDECS) | 2014年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：9 / 9
页数：1
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