Stochastic analysis of a two-unit warm standby system with slow switch subject to hardware and human error failures

被引：5
|
作者：
Mahmoud, MAW [1 ]
Esmail, MA
机构：
[1] Al Azhar Univ, Fac Sci, Dept Math, Cairo 11884, Egypt
[2] Teachers Coll Riyadh, Dept Math, Riyadh 11491, Saudi Arabia
来源：
MICROELECTRONICS AND RELIABILITY | 1998年 / 38卷 / 10期
关键词：
D O I：
10.1016/S0026-2714(97)00209-6
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In this paper several important measures of reliability for a two-unit warm standby system with slow switch subject to hardware and human error failures are obtained using regenerative points technique in Markov renewal processes. All times distributions are exponential except the repair times distributions are general. (C) 1998 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码：1639 / 1644
页数：6
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