Development of shielded reflection type pulsed eddy current testing probes for thickness evaluation

被引:2
|
作者
Shin, Young-Kil [1 ]
Choi, Dong-Myung [1 ]
Jang, Kwan-Seob [2 ]
机构
[1] Kunsan Natl Univ, Sch Elect & Informat Engn, Kunsan 573701, Chonbuk, South Korea
[2] Sae An Engn Corp, R&D Inst, Seoul 153803, South Korea
来源
MODERN PHYSICS LETTERS B | 2008年 / 22卷 / 11期
关键词
D O I
10.1142/S0217984908015619
中图分类号
O59 [应用物理学];
学科分类号
摘要
Reflection and send-receive type probe shielded by ferrite is designed to evaluate the thickness of test plate by a pulsed eddy current (PEC) method and effects of pulse width to PEC signal are investigated when a 10.5 mm thick, nonmagnetic plate is inspected. Results show that the best sensitivity to thickness variation can be achieved by the peak value of a PEC signal. Pulse width variation study suggests that the shorter pulse width is desired if the peak value or the zero crossing time is used to evaluate the thickness, while the longer pulse width is needed if the time to peak value is used to evaluate it.
引用
收藏
页码:923 / 928
页数:6
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