Monte Carlo simulations for the characterization of position-sensitive x-ray detectors dedicated to Compton polarimetry

被引：16
|
作者：
Weber, G. [1 ,2 ]
Braeuning, H. [1 ]
Maertin, R. [1 ,3 ]
Spillmann, U. [1 ]
Stoehlker, Th [1 ,2 ,3 ]
机构：
[1] GSI Helmholtzzentrum Schwerionenforsch, D-64921 Darmstadt, Germany
[2] Helmholtz Inst Jena, D-07743 Jena, Germany
[3] Univ Heidelberg, Inst Phys, D-69120 Heidelberg, Germany
来源：
PHYSICA SCRIPTA | 2011年 / T144卷
关键词：
PHOTONS;
D O I：
10.1088/0031-8949/2011/T144/014034
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
We present here a Monte Carlo program based on the EGS5 package for modeling the detector response of position-sensitive x-ray detectors. The program is used to estimate the polarimeter quality of two novel detector systems applied in Compton polarimetry. The validity of the underlying physical models is verified by comparing the simulation output to experimental data obtained at the experimental storage ring, ESR.
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页数：3
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