Nitridation and contrast of B4C/La interfaces and X-ray multilayer optics

被引:29
|
作者
Tsarfati, T. [1 ]
van de Kruijs, R. W. E. [1 ]
Zoethout, E. [1 ]
Louis, E. [1 ]
Bijkerk, F. [1 ,2 ]
机构
[1] FOM Inst Plasma Phys Rijnhuizen, Nieuwegein, Netherlands
[2] Univ Twente, MESA Inst Nanotechnol, NL-7500 AE Enschede, Netherlands
关键词
Multilayer; Lithography; X-FEL; GIXR; TEM; XPS; STRUCTURAL PHASE-STABILITY; DEPTH-RESOLUTION; ENHANCEMENT; GENERATION; MIRRORS; GROWTH;
D O I
10.1016/j.tsf.2010.04.088
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Chemical diffusion and interlayer formation in thin layers and at interfaces is of increasing influence in nanoscopic devices such as nano-electronics, magneto-optical storage and multilayer X-ray optics. We show that with the nitridation of reactive B4C/La interfaces, both the chemical and optical contrast can be greatly enhanced. Although interaction and diffusion of N-2 from the substrate towards the adlayer does occur, this surfactant mediated growth contributes to chemical and optical interface properties that enable major reflectivity improvements of multilayer optics for 6.7<lambda<7.0 nm. (C) 2010 Elsevier B.V. All rights reserved.
引用
收藏
页码:7249 / 7252
页数:4
相关论文
共 50 条
  • [41] Non-destructive X-ray study of the interphases in Mo/Si and Mo/B4C/Si/B4C multilayers
    Maury, H.
    Jonnard, P.
    Andre, J. -M.
    Gautier, J.
    Roulliay, M.
    Bridou, F.
    Delmotte, F.
    Ravet, M. -F.
    Jerome, A.
    Holliger, P.
    THIN SOLID FILMS, 2006, 514 (1-2) : 278 - 286
  • [42] X-ray multilayer optics: growth and characterization
    Lodha, GS
    Raghuvanshi, VK
    Modi, MH
    Tripathi, P
    Verma, A
    Nandedkar, RV
    VACUUM, 2001, 60 (04) : 385 - 388
  • [43] SYNTHESIZED MULTILAYER FRESNEL X-RAY OPTICS
    ERKO, AI
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1989, 60 (07): : 2502 - 2502
  • [44] EUV and soft X-ray multilayer optics
    Kaiser, N
    Yulin, S
    Feigl, T
    Bernitzki, H
    Lauth, H
    ADVANCES IN OPTICAL THIN FILMS, 2003, 5250 : 109 - 118
  • [45] High resolution multilayer x-ray optics
    Morawe, C
    Peffen, JC
    Ziegler, E
    Freund, AK
    ADVANCES IN X-RAY OPTICS, 2001, 4145 : 61 - 71
  • [46] Multilayer optics for hard X-ray astronomy
    Romaine, S
    Ivan, A
    Bruni, R
    Christensen, F
    Harrison, F
    Craig, W
    Gorenstein, P
    X-RAY OPTICS, INSTRUMENTS, AND MISSIONS IV, 2000, 4138 : 120 - 125
  • [47] Multilayer dispersion optics for X-ray radiation
    Andreev, SS
    Mertins, HC
    Platonov, YY
    Salashchenko, NN
    Schaefers, F
    Shamov, EA
    Shmaenok, LA
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2000, 448 (1-2): : 133 - 141
  • [48] EUV/soft x-ray multilayer optics
    Yulin, S
    Feigl, T
    Benoit, N
    Kaiser, N
    ADVANCED MICROLITHOGRAPHY TECHNOLOGIES, 2005, 5645 : 289 - 298
  • [49] Multilayer films for figured X-ray optics
    Windt, DL
    CRYSTAL AND MULTILAYER OPTICS, 1998, 3448 : 280 - 290
  • [50] X-RAY TESTS OF MULTILAYER COATED OPTICS
    GOLUB, L
    SPILLER, E
    BARTLETT, RJ
    HOCKADAY, MP
    KANIA, DR
    TRELA, WJ
    TATCHYN, R
    APPLIED OPTICS, 1984, 23 (20): : 3529 - 3533