Given a topology of local parity-check constraints, a maximally recoverable code (MRC) can correct all erasure patterns that are information-theoretically correctable. In a grid-like topology, there are a local constraints in every column forming a column code, b local constraints in every row forming a row code, and h global constraints in an (m x n) grid of codeword. Recently, Gopalan et al. initiated the study of MRCs under grid-like topology, and derived a necessary and sufficient condition, termed as the regularity condition, for an erasure pattern to be recoverable when a = 1; h = 0. In this paper, we consider MRCs for product topology (h = 0). First, we construct a certain bipartite graph based on the erasure pattern satisfying the regularity condition for product topology (any a; b, h = 0) and show that there exists a complete matching in this graph. We then present an alternate direct proof of the sufficient condition when a = 1; h = 0. We later extend our technique to study the topology for a = 2; h = 0, and characterize a subset of recoverable erasure patterns in that case. For both a = 1; 2, our method of proof is uniform, i.e., by constructing tensor product G(col) circle times G(row) of generator matrices of column and row codes such that certain square sub-matrices retain full rank. The full-rank condition is proved by resorting to the matching identified earlier and also another set of matchings in erasure sub-patterns.
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Int Inst Informat Technol, Signal Proc & Commun Res Ctr, Hyderabad 500032, IndiaInt Inst Informat Technol, Signal Proc & Commun Res Ctr, Hyderabad 500032, India
Shivakrishna, D.
Nair, Aaditya M.
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Meta, London N1C 4BE, EnglandInt Inst Informat Technol, Signal Proc & Commun Res Ctr, Hyderabad 500032, India
Nair, Aaditya M.
Lalitha, V.
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Int Inst Informat Technol, Signal Proc & Commun Res Ctr, Hyderabad 500032, IndiaInt Inst Informat Technol, Signal Proc & Commun Res Ctr, Hyderabad 500032, India
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Univ St Gallen, Fac Math & Stat, Dufourstr 50, CH-9000 St Gallen, SwitzerlandUniv St Gallen, Fac Math & Stat, Dufourstr 50, CH-9000 St Gallen, Switzerland
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Univ Fed Rio de Janeiro, Inst Matemat, BR-21941909 Rio De Janeiro, Brazil
Univ Groningen, Bernoulli Inst, NL-9747 Groningen, NetherlandsUniv Fed Rio de Janeiro, Inst Matemat, BR-21941909 Rio De Janeiro, Brazil
Salgado, Cecilia
Varilly-Alvarado, Anthony
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Rice Univ, Dept Math, Houston, TX 77005 USAUniv Fed Rio de Janeiro, Inst Matemat, BR-21941909 Rio De Janeiro, Brazil
Varilly-Alvarado, Anthony
Voloch, Jose Felipe
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Univ Canterbury, Sch Math & Stat, Christchurch 8140, New ZealandUniv Fed Rio de Janeiro, Inst Matemat, BR-21941909 Rio De Janeiro, Brazil
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Univ Calif San Diego, Dept Elect & Comp Engn, Ctr Memory & Recording Res, La Jolla, CA 92093 USA
Western Digital Corp, Milpitas, CA 95035 USAUniv Calif San Diego, Dept Elect & Comp Engn, Ctr Memory & Recording Res, La Jolla, CA 92093 USA
Huang, Pengfei
Yaakobi, Eitan
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Univ Calif San Diego, Ctr Memory & Recording Res, La Jolla, CA 92093 USA
Technion Israel Inst Technol, Dept Comp Sci, IL-32000 Haifa, IsraelUniv Calif San Diego, Dept Elect & Comp Engn, Ctr Memory & Recording Res, La Jolla, CA 92093 USA
Yaakobi, Eitan
Siegel, Paul H.
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Univ Calif San Diego, Dept Elect & Comp Engn, Ctr Memory & Recording Res, La Jolla, CA 92093 USAUniv Calif San Diego, Dept Elect & Comp Engn, Ctr Memory & Recording Res, La Jolla, CA 92093 USA
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Univ Maryland, Syst Res Inst, College Pk, MD 20742 USA
Tel Aviv Univ, Dept Elect Engn Syst, IL-39040 Tel Aviv, IsraelUniv Maryland, Syst Res Inst, College Pk, MD 20742 USA
Tamo, Itzhak
Barg, Alexander
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Univ Maryland, Syst Res Inst, Dept Elect & Comp Engn, College Pk, MD 20742 USA
Russian Acad Sci, IITP, Moscow 127051, Russia
Univ Maryland, Syst Res Inst, College Pk, MD 20742 USAUniv Maryland, Syst Res Inst, College Pk, MD 20742 USA
Barg, Alexander
Frolov, Alexey
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Russian Acad Sci, IITP, Moscow 127051, Russia
Univ Maryland, Syst Res Inst, College Pk, MD 20742 USAUniv Maryland, Syst Res Inst, College Pk, MD 20742 USA