Nano-metrology and terrain modelling - convergent practice in surface characterisation

被引：4
|
作者：
Pike, RJ [1 ]
机构：
[1] US Geol Survey, Menlo Park, CA 94025 USA
来源：
TRIBOLOGY INTERNATIONAL | 2000年 / 33卷 / 09期
关键词：
surface characterisation; surface roughness; three-dimensional surface topography;
D O I：
10.1016/S0301-679X(00)00075-X
中图分类号：
TH [机械、仪表工业];
学科分类号：
0802 ;
摘要：
The quantification of magnetic-tape and disk topography has a macro-scale counterpart in the Earth sciences - terrain modelling, the numerical representation of relief and pattern of the ground surface. The two practices arose independently and continue to function separately. This methodological paper introduces terrain modelling, discusses its similarities to and differences from industrial surface metrology, and raises the possibility of a unified discipline of quantitative surface characterisation. A brief discussion of an Earth-science problem, subdividing a heterogeneous terrain surface from a set of sample measurements, exemplifies a multivariate statistical procedure that may transfer to tribological applications of 3-D metrological height data. (C) 2000 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码：593 / 600
页数：8
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