Automated synthesis of large phase shifters for built-in self-test

被引：48

作者：

Rajski, J ^{[1
]}

Tamarapalli, N ^{[1
]}

Tyszer, J ^{[1
]}

机构：

[1] Mentor Graph Corp, Wilsonville, OR 97070 USA

来源：

INTERNATIONAL TEST CONFERENCE 1998, PROCEEDINGS | 1998年

关键词：

D O I：

10.1109/TEST.1998.743303

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

The paper introduces a new algorithm for the automated synthesis of phase shifters - circuits used to remove effects of structural dependencies featured by two-dimensional test generators. The algorithms presented in the paper synthesize in a time-efficient manner very large and fast phase shifters for built-in self-test environment, with guaranteed minimal phaseshifts between scan chains, and very low delay and area of virtually one 2-way XOR gate per channel.

引用

页码：1047 / 1056

页数：10

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