Automated test system for the characterization of switching regulators using VXI instrumentation

被引：0
|
作者：
Lazaro, AM [1 ]
Sanchez, F [1 ]
Ramos, R [1 ]
Guinjoan, F [1 ]
机构：
[1] UNIV POLITECN CATALUNYA,DEPT ELECTR ENGN,E-08800 VILANOVA I GELTRU,BARCELONA,SPAIN
来源：
JOINT CONFERENCE - 1996: IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE & IMEKO TECHNICAL COMMITTEE 7, CONFERENCE PROCEEDINGS, VOLS I AND II: QUALITY MEASUREMENTS: THE INDISPENSABLE BRIDGE BETWEEN THEORY AND REALITY (NO MEASUREMENTS? NO SCIENCE!) | 1996年
关键词：
D O I：
暂无
中图分类号：
TP18 [人工智能理论];
学科分类号：
081104 ; 0812 ; 0835 ; 1405 ;
摘要：
引用
收藏
页码：187 / 191
页数：5
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