Automated test system for the characterization of switching regulators using VXI instrumentation

被引：0
|
作者：
Lazaro, AM [1 ]
Sanchez, F [1 ]
Ramos, R [1 ]
Guinjoan, F [1 ]
机构：
[1] UNIV POLITECN CATALUNYA,DEPT ELECTR ENGN,E-08800 VILANOVA I GELTRU,BARCELONA,SPAIN
来源：
JOINT CONFERENCE - 1996: IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE & IMEKO TECHNICAL COMMITTEE 7, CONFERENCE PROCEEDINGS, VOLS I AND II: QUALITY MEASUREMENTS: THE INDISPENSABLE BRIDGE BETWEEN THEORY AND REALITY (NO MEASUREMENTS? NO SCIENCE!) | 1996年
关键词：
D O I：
暂无
中图分类号：
TP18 [人工智能理论];
学科分类号：
081104 ; 0812 ; 0835 ; 1405 ;
摘要：
引用
收藏
页码：187 / 191
页数：5
相关论文
共 50 条
  • [1] An automated design system for switching power regulators
    Usami, Y
    Inagaki, Y
    Nakahara, M
    Harada, K
    PESC 04: 2004 IEEE 35TH ANNUAL POWER ELECTRONICS SPECIALISTS CONFERENCE, VOLS 1-6, CONFERENCE PROCEEDINGS, 2004, : 848 - 853
  • [2] An automated design system for switching power regulators
    Usami, Y
    Inagaki, Y
    Nakahara, M
    Harada, K
    INTELEC'03: POWERING THE BROADBAND NETWORK, PROCEEDINGS, 2003, : 334 - 339
  • [3] VXI-TEST - PROGRAMMABLE SWITCHING WITH VXI - A TUTORIAL
    LUM, J
    EE-EVALUATION ENGINEERING, 1995, 34 (10): : 47 - &
  • [4] Signal switching in automated test system for the transfer function characterization
    Mànuel, A
    Roset, X
    Gòmez, J
    Garrido, A
    Carlosena, A
    Ramos, R
    IMTC/99: PROCEEDINGS OF THE 16TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS. 1-3, 1999, : 1206 - 1210
  • [5] VXI or PXI test system improvement using DSP
    Mielke, JA
    IEEE AEROSPACE AND ELECTRONIC SYSTEMS MAGAZINE, 2005, 20 (07) : 7 - 10
  • [6] Using VXI to reduce test-system size and cost
    Kolts, B
    ELECTRONIC PRODUCTS MAGAZINE, 2000, 42 (08): : 65 - 66
  • [7] Automated test system with dynamic scheduling for switching systems
    Ohmori, K
    Ono, K
    ICC 98 - 1998 IEEE INTERNATIONAL CONFERENCE ON COMMUNICATIONS VOLS 1-3, 1998, : 319 - 323
  • [8] Creep test system of VXI BUS
    Wang, Yaorong
    Gaojishu Tongxin/High Technology Letters, 1996, 6 (06):
  • [9] Automated test equipment synthetic instrumentation
    Dare, Earl H., III
    AUTOTESTCON 2005, 2005, : 175 - 179
  • [10] On results using automated wideband instrumentation for radar measurements and characterization
    Govoni, Mark A.
    Dogaru, Traian
    Le, Calvin
    Sobezak, Kevin
    RADAR SENSOR TECHNOLOGY XXI, 2017, 10188
12345