Fine scale resolution of ceramic microstructures by X-ray computed tomography: An economical approach

被引:0
|
作者
Huss, SP [1 ]
Gray, JN [1 ]
Schilling, CH [1 ]
机构
[1] Iowa State Univ, Ames Lab, Ames, IA 50010 USA
来源
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D O I
暂无
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
High-magnification, 3-dimensional imaging of ceramics by x-ray computed tomography (CT) typically requires use of a synchrotron and / or a massive array of solid-state detectors. The high cost of this research equipment generally limits its use as a process-development tool by ceramic manufacturers. In this paper, we demonstrate a more economical approach which produces image quality comparable to that of standard, high performance equipment. In this method we utilized an inexpensive image intensifier and applied techniques of frame averaging, gray-scale sub-ranging and other noise reduction and artifact removal methods in order to improve contrast sensitivity while maintaining low cost. After discussing critical factors affecting image quality, we discuss cost / performance tradeoffs associated with different CT equipment options.
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页码:59 / 66
页数:8
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