Improving the visibility of phase gratings for Talbot-Lau X-ray imaging

被引：7

作者：

Shashev, Yury ^{[1
]}

Kupsch, Andreas ^{[1
]}

Lange, Axel ^{[1
]}

Mueller, Bernd R. ^{[2
]}

Bruno, Giovanni ^{[3
,4
,5
,6
,7
]}

机构：

[1] BAM Fed Inst Mat Res & Testing, Berlin, Germany

[2] BAM Fed Inst Mat Res & Testing, Xray Topog Grp, Berlin, Germany

[3] Open Univ, Milton Keynes, Bucks, England

[4] Hahn Meitner Inst Berlin GmbH, Berlin, Germany

[5] Inst Laue Langevin, Grenoble, France

[6] BAM Fed Inst Mat Res & Testing, Micro NDE 8 5, Berlin, Germany

[7] Univ Potsdam, Potsdam, Germany

来源：

MATERIALS TESTING | 2016年 / 58卷 / 11-12期

关键词：

Talbot-Lau interferometry; phase grating; synchrotron imaging; visibility; X-ray refraction; INTERFEROMETER; CONTRAST;

D O I：

10.3139/120.110948

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Talbot-Lau interferometry provides X-ray imaging techniques with significant enhancement of the radiographic contrast of weakly absorbing objects. The grating based technique allows separation of absorption, refraction and small angle scattering effects. The different efficiency of rectangular and triangular shaped phase gratings at varying detector distances is investigated. The interference patterns (Talbot carpets) are modeled for parallel monochromatic radiation and measured by synchrotron radiation. In comparison to rectangular shapes of phase gratings much higher visibility is obtained for triangular shapes which yield enhanced contrast of a glass capillary test specimen.

引用

页码：970 / 974

页数：5

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