Talbot-Lau X-Ray Density Diagnostic for High Energy Density Plasmas

被引：0

作者：

Valdivia, M. P. ^{[1
]}

Stutman, D. ^{[1
]}

Finkenthal, M. ^{[1
]}

Regan, S. P. ^{[2
]}

Stoeckl, C. ^{[2
]}

Mileham, C. ^{[2
]}

Begishev, I. ^{[2
]}

机构：

[1] Johns Hopkins Univ, Dept Phys & Astron, Baltimore, MD 21218 USA

[2] Univ Rochester, Lab Laser Energet, Rochester, NY 14623 USA

来源：

2015 IEEE 26TH SYMPOSIUM ON FUSION ENGINEERING (SOFE) | 2015年

关键词：

X-ray imaging; Refraction diagnostics; HED diagnostic; Phase-shift; PHASE RETRIEVAL; AMPLIFIER;

D O I：

暂无

中图分类号：

TL [原子能技术]; O571 [原子核物理学];

学科分类号：

0827 ; 082701 ;

摘要：

Phase-contrast x-ray diagnostics can detect density gradients in low-Z matter with the sensitivity and spatial resolution required in High Energy Density (HED) plasma experiments. Talbot-Lau interferometry measures x-ray beam deviations due to refraction index gradients in its path. It can simultaneously provide x-ray attenuation, refraction, elemental composition, and scatter images of a low-Z object. We have developed the Talbot-Lau Moire X-ray Deflectometry (TXD) single image technique based on phase-retrieval. The results obtained at 8 and 17 keV with high magnification using low-Z test objects suggest a clear advantage of TXD as HED electron density diagnostic over conventional radiography. The Moire technique can detect sharp and smooth density gradients with source-limited spatial resolution. Also, TXD can use extended, incoherent, line or continuum x-ray sources, allowing for a wide range of backlighters.

引用

页数：5

共 50 条

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