Polarization-dependent x-ray absorption spectroscopy of hexagonal and orthorhombic TbMnO3 thin films

被引：4

作者：

Wu, K. H. ^{[1
]}

Gou, I. C. ^{[1
]}

Luo, C. W. ^{[1
]}

Uen, T. M. ^{[1
]}

Lin, J-Y

Juang, J. Y. ^{[1
]}

Kobayashi, T. ^{[1
]}

Chen, C. K.

Lee, J. M. ^{[1
]}

Chen, J. M.

机构：

[1] Natl Chiao Tung Univ, Dept Electrophys, Hsinchu 300, Taiwan

来源：

INTERNATIONAL CONFERENCE ON MAGNETISM (ICM 2009) | 2010年 / 200卷

关键词：

D O I：

10.1088/1742-6596/200/1/012227

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Pure phase TbMnO3 manganite thin films with hexagonal (h-TMO) and orthorhombic (o- TMO) crystal structures were prepared by pulsed laser deposition. The distinctive orientation alignments between film and substrate obtained here have allowed us to perform the x-ray absorption near edge spectroscopy (XANES) measurements with the electric field applied along the three major crystallographic directions. The XANES results, as expected, display significantly different spectral features for the h-TMO and o-TMO films. In addition, the XANES spectra also exhibit strong polarization dependence at O K and Mn L edges for both samples.

引用

页数：4

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