Polarization-dependent x-ray absorption spectroscopy of hexagonal and orthorhombic TbMnO3 thin films

被引：4
|
作者：
Wu, K. H. [1 ]
Gou, I. C. [1 ]
Luo, C. W. [1 ]
Uen, T. M. [1 ]
Lin, J-Y
Juang, J. Y. [1 ]
Kobayashi, T. [1 ]
Chen, C. K.
Lee, J. M. [1 ]
Chen, J. M.
机构：
[1] Natl Chiao Tung Univ, Dept Electrophys, Hsinchu 300, Taiwan
来源：
INTERNATIONAL CONFERENCE ON MAGNETISM (ICM 2009) | 2010年 / 200卷
关键词：
D O I：
10.1088/1742-6596/200/1/012227
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Pure phase TbMnO3 manganite thin films with hexagonal (h-TMO) and orthorhombic (o- TMO) crystal structures were prepared by pulsed laser deposition. The distinctive orientation alignments between film and substrate obtained here have allowed us to perform the x-ray absorption near edge spectroscopy (XANES) measurements with the electric field applied along the three major crystallographic directions. The XANES results, as expected, display significantly different spectral features for the h-TMO and o-TMO films. In addition, the XANES spectra also exhibit strong polarization dependence at O K and Mn L edges for both samples.
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页数：4
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