Photoinduced Degradation Studies of Organic Solar Cell Materials Using Kelvin Probe Force and Conductive Scanning Force Microscopy

被引:28
|
作者
Sengupta, Esha [1 ]
Domanski, Anna L. [1 ]
Weber, Stefan A. L. [1 ]
Untch, Maria B. [1 ]
Butt, Hans-Juergen [1 ]
Sauermann, Tobias [2 ]
Egelhaaf, Hans J. [2 ]
Berger, Ruediger [1 ]
机构
[1] Max Planck Inst Polymer Res, D-55128 Mainz, Germany
[2] Konarka Technol GmbH, D-90443 Nurnberg, Germany
来源
JOURNAL OF PHYSICAL CHEMISTRY C | 2011年 / 115卷 / 40期
关键词
POWER CONVERSION EFFICIENCY; POLYMER; OXYGEN; PHOTOGENERATION;
D O I
10.1021/jp2048713
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We investigated the photoinduced changes in the surface potential and conductivity for locally degraded active layers of organic solar cell materials using electrical modes of scanning force microscopy. Samples were degraded under different partial pressures of oxygen and humidity in the presence of light. Degraded and nondegraded areas were investigated by Kelvin Probe Force Microscopy (KPFM) and conductive scanning force microscopy (cSFM). The analysis allowed us to quantify the extent of degradation and compensate the contribution of the probe tip. Two typical blends used for organic solar cell, i.e., P3HT:PCBM and PCPDTBT:PCBM, were investigated. We observed that P3HT:PCBM photodegraded significantly more than PCPDTBT:PCBM for an environment containing oxygen. For short photodegradation times (1 h), we verified that changes in the surface potential and conductivity of P3HT:PCBM films were fully reversible after annealing. For individual layers of P3HT and PCBM, we found that only P3HT degrades. However, the blend material of P3HT and PCBM leads to an accelerated degradation supporting the interpretation that PCBM undergoes a series of oxidations in the blend.
引用
收藏
页码:19994 / 20001
页数:8
相关论文
共 50 条
  • [31] Enhanced Spatial Resolution Scanning Kelvin Force Microscopy Using Conductive Carbon Nanotube Tips
    Kopanski, Joseph J.
    McClure, Paul
    Mancevski, Vladimir
    FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2009, 2009, 1173 : 212 - +
  • [32] Kelvin probe force microscopy imaging using carbon nanotube probe
    Takahashi, S
    Kishida, T
    Akita, S
    Nakayama, Y
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2001, 40 (6B): : 4314 - 4316
  • [33] The resistive switching in TiO2 films studied by conductive atomic force microscopy and Kelvin probe force microscopy
    Du, Yuanmin
    Kumar, Amit
    Pan, Hui
    Zeng, Kaiyang
    Wang, Shijie
    Yang, Ping
    Wee, Andrew Thye Shen
    AIP ADVANCES, 2013, 3 (08):
  • [34] Quantitative scanning tunneling microscopy and scanning force microscopy of organic materials
    Butt, H.-J.
    Guckenberger, R.
    Rabe, J.P.
    Ultramicroscopy, 1992, 45 (1-4) : 375 - 393
  • [35] QUANTITATIVE SCANNING TUNNELING MICROSCOPY AND SCANNING FORCE MICROSCOPY OF ORGANIC MATERIALS
    BUTT, HJ
    GUCKENBERGER, R
    RABE, JP
    ULTRAMICROSCOPY, 1992, 46 (1-4) : 375 - 393
  • [36] Study of the tribocorrosion behaviors of albumin on a cobalt-based alloy using scanning Kelvin probe force microscopy and atomic force microscopy
    Yan, Yu
    Yang, Hongjuan
    Su, Yanjing
    Qiao, Lijie
    ELECTROCHEMISTRY COMMUNICATIONS, 2016, 64 : 61 - 64
  • [37] Nanoelectronic Properties of a Model System and of a Conjugated Polymer: A Study by Kelvin Probe Force Microscopy and Scanning Conductive Torsion Mode Microscopy
    Sun, Ling
    Wang, Jianjun
    Bonaccurso, Elmar
    JOURNAL OF PHYSICAL CHEMISTRY C, 2010, 114 (15): : 7161 - 7168
  • [38] Electronic characterization of organic thin films by Kelvin probe force microscopy
    Palermo, V
    Palma, M
    Samorì, P
    ADVANCED MATERIALS, 2006, 18 (02) : 145 - 164
  • [39] PREDICTABLE BEHAVIOR OF ORGANIC PHOTOVOLTAIC CELLS BY KELVIN PROBE FORCE MICROSCOPY
    Roche, R.
    Lereu, A. L.
    Dumas, Ph.
    PHYSICS, CHEMISTRY AND APPLICATIONS OF NANOSTRUCTURES: REVIEWS AND SHORT NOTES, 2013, : 480 - 486
  • [40] Cross Kelvin force microscopy and conductive atomic force microscopy studies of organic bulk heterojunction blends for local morphology and electrical behavior analysis
    Villeneuve-Faure, C.
    Le Borgne, D.
    Bedel-Pereira, E.
    Chane-Ching, K. I. Moineau
    Hernandez-Maldonado, D.
    Seguy, I.
    JOURNAL OF APPLIED PHYSICS, 2015, 117 (05)