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- [21] Distinguishing negatively-charged and highly conductive dislocations in gallium nitride using scanning Kelvin probe and conductive atomic force microscopy GAN AND RELATED ALLOYS-2002, 2003, 743 : 35 - 40
- [22] Scanning capacitance force microscopy and Kelvin probe force microscopy of nanostructures embedded in SiO2 SCANNING PROBE MICROSCOPY: CHARACTERIZATION, NANOFABRICATION AND DEVICE APPLICATION OF FUNCTIONAL MATERIALS, 2005, 186 : 405 - +
- [27] Scanning Kelvin Probe Force Bicroscopy studies of corrosion. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2000, 220 : U102 - U102