Photoinduced Degradation Studies of Organic Solar Cell Materials Using Kelvin Probe Force and Conductive Scanning Force Microscopy

被引:28
|
作者
Sengupta, Esha [1 ]
Domanski, Anna L. [1 ]
Weber, Stefan A. L. [1 ]
Untch, Maria B. [1 ]
Butt, Hans-Juergen [1 ]
Sauermann, Tobias [2 ]
Egelhaaf, Hans J. [2 ]
Berger, Ruediger [1 ]
机构
[1] Max Planck Inst Polymer Res, D-55128 Mainz, Germany
[2] Konarka Technol GmbH, D-90443 Nurnberg, Germany
来源
JOURNAL OF PHYSICAL CHEMISTRY C | 2011年 / 115卷 / 40期
关键词
POWER CONVERSION EFFICIENCY; POLYMER; OXYGEN; PHOTOGENERATION;
D O I
10.1021/jp2048713
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We investigated the photoinduced changes in the surface potential and conductivity for locally degraded active layers of organic solar cell materials using electrical modes of scanning force microscopy. Samples were degraded under different partial pressures of oxygen and humidity in the presence of light. Degraded and nondegraded areas were investigated by Kelvin Probe Force Microscopy (KPFM) and conductive scanning force microscopy (cSFM). The analysis allowed us to quantify the extent of degradation and compensate the contribution of the probe tip. Two typical blends used for organic solar cell, i.e., P3HT:PCBM and PCPDTBT:PCBM, were investigated. We observed that P3HT:PCBM photodegraded significantly more than PCPDTBT:PCBM for an environment containing oxygen. For short photodegradation times (1 h), we verified that changes in the surface potential and conductivity of P3HT:PCBM films were fully reversible after annealing. For individual layers of P3HT and PCBM, we found that only P3HT degrades. However, the blend material of P3HT and PCBM leads to an accelerated degradation supporting the interpretation that PCBM undergoes a series of oxidations in the blend.
引用
收藏
页码:19994 / 20001
页数:8
相关论文
共 50 条
  • [21] Distinguishing negatively-charged and highly conductive dislocations in gallium nitride using scanning Kelvin probe and conductive atomic force microscopy
    Simpkins, BS
    Yu, ET
    Waltereit, P
    Speck, JS
    GAN AND RELATED ALLOYS-2002, 2003, 743 : 35 - 40
  • [22] Scanning capacitance force microscopy and Kelvin probe force microscopy of nanostructures embedded in SiO2
    Tallarida, G
    Spiga, S
    Fanciulli, M
    SCANNING PROBE MICROSCOPY: CHARACTERIZATION, NANOFABRICATION AND DEVICE APPLICATION OF FUNCTIONAL MATERIALS, 2005, 186 : 405 - +
  • [23] Characterization of phases in duplex stainless steel by magnetic force microscopy/scanning kelvin probe force microscopy
    Sathirachinda, Namurata
    Gubner, Rolf
    Pan, Jinshan
    Kivisakk, Ulf
    ELECTROCHEMICAL AND SOLID STATE LETTERS, 2008, 11 (07) : C41 - C45
  • [24] High-resolution Kelvin probe microscopy in corrosion science: Scanning Kelvin probe force microscopy (SKPFM) versus classical scanning Kelvin probe (SKP)
    Rohwerder, Michael
    Turcu, Florin
    ELECTROCHIMICA ACTA, 2007, 53 (02) : 290 - 299
  • [25] Characterization of corrosion interfaces by the scanning Kelvin probe force microscopy technique
    Guillaumin, V
    Schmutz, P
    Frankel, GS
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2001, 148 (05) : B163 - B173
  • [26] Investigation of hydrogen evolution and enrichment by scanning Kelvin probe force microscopy
    Wang, Gang
    Yan, Yu
    Yang, Xina
    Li, Jinxu
    Qiao, Lijie
    ELECTROCHEMISTRY COMMUNICATIONS, 2013, 35 : 100 - 103
  • [27] Scanning Kelvin Probe Force Bicroscopy studies of corrosion.
    Schmutz, P
    Devecchio, D
    Guillaumin, V
    Frankel, GS
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2000, 220 : U102 - U102
  • [28] Integrated Tapping Mode Kelvin Probe Force Microscopy with Photoinduced Force Microscopy for Correlative Chemical and Surface Potential Mapping
    Jakob, Devon S.
    Li, Nengxu
    Zhou, Huanping
    Xu, Xiaoji G.
    SMALL, 2021, 17 (37)
  • [29] Electronic characterization of supramolecular materials at the nanoscale by Conductive Atomic Force and Kelvin Probe Force microscopies
    Musumeci, Chiara
    Liscio, Andrea
    Palermo, Vincenzo
    Samori, Paolo
    MATERIALS TODAY, 2014, 17 (10) : 504 - 517
  • [30] Detection of secondary phases in duplex stainless steel by magnetic force microscopy and scanning Kelvin probe force microscopy
    Ramirez-Salgado, J.
    Dominguez-Aguilar, M. A.
    Castro-Dominguez, B.
    Hernandez-Hernandez, P.
    Newman, R. C.
    MATERIALS CHARACTERIZATION, 2013, 86 : 250 - 262