XPS Study of Thermally Evaporated Ge-Sb-Te Amorphous Thin Films

被引：1
|
作者：
Kumar, Sandeep [1 ]
Singh, Digvijay [1 ]
Thangaraj, R. [1 ]
机构：
[1] Guru Nanak Dev Univ, Semicond Lab, Dept Phys, Amritsar 143005, Punjab, India
来源：
INTERNATIONAL CONFERENCE ON ADVANCES IN CONDENSED AND NANO MATERIALS (ICACNM-2011) | 2011年 / 1393卷
关键词：
chalcogenide; thin film; x-ray photoelectron spectroscopy; PHASE-CHANGE; GE2SB2TE5; SILVER;
D O I：
10.1063/1.3653649
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
Amorphous thin films were prepared from the bulk composition of Ge(22)Sb(22)Te(56) (GST) alloy by thermal evaporation in good vacuum condition. The amorphous nature of as-deposited films was checked with x-ray diffraction (XRD) studies. X-ray photoelectron spectroscopy (XPS) has been used to determine the binding energies of the core electrons in amorphous thin GST films. In XPS, we performed the survey scan from the binding energy (BE) range from 0-1100 eV and core level spectra of Ge 3d, Sb 3d and Te 3d.
引用
收藏
页数：2
相关论文
共 50 条
  • [11] Electrical properties and transport mechanisms in Ge-Sb-Te thin films
    Lazarenko, P.
    Sherchenkov, A.
    Kozyukhin, S.
    Babich, A.
    Timoshenkov, S.
    Shuliatyev, A.
    Kudoyarova, V.
    JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 2016, 18 (1-2): : 50 - 55
  • [12] OPTICAL AND MORPHOLOGICAL INVESTIGATIONS OF CHALCOGENIDE GE-SB-TE THIN FILMS
    Stan, Nicoleta
    Nedelcu, Nicoleta
    Chiroiu, Veturia
    Munteanu, Ligia
    Ionescu, Marius
    PROCEEDINGS OF THE ROMANIAN ACADEMY SERIES A-MATHEMATICS PHYSICS TECHNICAL SCIENCES INFORMATION SCIENCE, 2022, 23 (03): : 245 - 255
  • [13] Capacitance-voltage measurements of Ge-Sb-Te thin films
    Ghamlouche, H.
    Mahmoud, S. T.
    Qamhieh, N.
    Ahmed, S.
    Al-Shamisi, H.
    PHYSICA SCRIPTA, 2008, 77 (01)
  • [14] Structural transformations of silver photodoped Ge-Sb-Te thin films
    Kumar, S.
    Singh, D.
    Thangaraj, R.
    OPTOELECTRONICS AND ADVANCED MATERIALS-RAPID COMMUNICATIONS, 2011, 5 (09): : 920 - 923
  • [15] Electrical properties and transport mechanisms in Ge-Sb-Te thin films
    Kozyukhin, S. (sergkoz@igic.ras.ru), 1600, National Institute of Optoelectronics (18): : 1 - 2
  • [16] Local structural change of amorphous Ge-Sb-Te thin film on annealing
    Naito, M
    Ishimaru, M
    Hirotsu, Y
    Takashima, M
    JOURNAL OF NON-CRYSTALLINE SOLIDS, 2004, 345 : 112 - 115
  • [17] Crystalline and amorphous structures of Ge-Sb-Te nanoparticles
    Park, Gyeong-Su
    Kwon, Ji-Hwan
    Kim, Miyoung
    Yoon, H.R.
    Jo, W.
    Kim, T.K.
    Zuo, Jian-Min
    Khang, Yoonho
    Journal of Applied Physics, 2007, 102 (01):
  • [18] STRUCTURAL STUDY OF SILVER PHOTODOPED Ge-Sb-Te FILMS
    Kumar, Sandeep
    Singh, Digvijay
    Thangaraj, R.
    CHALCOGENIDE LETTERS, 2011, 8 (05): : 355 - 361
  • [19] Structural, electrical and optical study of thermally evaporated Ge8Sb2Te11 thin films
    Kumar, S.
    Singh, D.
    Thangaraj, R.
    THIN SOLID FILMS, 2013, 531 : 577 - 582
  • [20] Crystalline and amorphous structures of Ge-Sb-Te nanoparticles
    Park, Gyeong-Su
    Kwon, Ji-Hwan
    Kim, Miyoung
    Yoon, H. R.
    Jo, W.
    Kim, T. K.
    Zuo, Jian-Min
    Khang, Yoonho
    JOURNAL OF APPLIED PHYSICS, 2007, 102 (01)
12345