Compact Modeling of the Switching Dynamics and Temperature Dependencies in TiOx Memristors-Part II: Physics-Based Model

被引:3
|
作者
Vaidya, Dhirendra [1 ]
Kothari, Shraddha [1 ]
Abbey, Thomas [1 ]
Stathopoulos, Spyros [1 ]
Michalas, Loukas [1 ]
Serb, Alexantrou [1 ]
Prodromakis, Themis [1 ]
机构
[1] Univ Southampton, Ctr Elect Frontiers, Southampton SO17 1BJ, Hants, England
基金
英国工程与自然科学研究理事会;
关键词
Compact model; metal-oxide memristors; physics-based model; pulsed resistance transient (PRT) measurements; resistive RAMs; Schottky emission; static I-V; switching dynamics; temperature dependence; TiOx memristors;
D O I
10.1109/TED.2021.3102002
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In the second part of this series, we propose a physics-based model for describing the temperature dependence of TiOx-based memristors, both switching and static. We show that the current-voltage (I-V) characteristics of memristor in the nonswitching regime, indicating a Schottky emission mechanism, can be described by minor modifications to the Schottky current equation. This leads to a physics-based static I-V compact model. Simultaneously, we show that the temperature dependence of the switching dynamics model parameters naturally emerges as a mere scaling factor from the static I-V model. This is a computationally efficient approach, which does not require any additional parameters to extend the switching dynamics model for incorporating thermal dependence.
引用
收藏
页码:4885 / 4890
页数:6
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