Design for Reliability for Low Power Digital Circuits

被引：0
|
作者：
Kalpat, Sriram [1 ]
机构：
[1] Qualcomm, San Diego, CA 92121 USA
来源：
2014 INTERNATIONAL SYMPOSIUM ON VLSI DESIGN, AUTOMATION AND TEST (VLSI-DAT) | 2014年
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中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
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页数：1
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