Status of the XMIS x-ray backscatter radiography land mine detection system

被引:0
|
作者
Dugan, ET [1 ]
Jacobs, AM [1 ]
Su, Z [1 ]
Houssay, L [1 ]
Ekdahl, D [1 ]
机构
[1] Univ Florida, Gainesville, FL 32611 USA
关键词
land mine detection; Compton backscatter; x-ray imaging; confirmation sensor;
D O I
10.1117/12.485860
中图分类号
O69 [应用化学];
学科分类号
081704 ;
摘要
An X-ray mine imaging system (XMIS) that uses a new form of backscatter x-ray radiography developed at the University of Florida was successfully field-tested at Fort A.P. Hill, Virginia in October, 2001. The XMIS obtained high quality images of both AP and AT mines on several of the Fort A.P. Hill test lanes. For high resolution imaging at a power level of 750 watts, total time for scanning and for processed image acquisition was about 60 s for a 0.5 m x 0.5 m area. The very good imaging results obtained from the initial field tests at Fort Hill with the XMIS demonstrate the excellent capabilities of this system as a confirmation sensor for land mine detection. These initial field tests showed that some fairly simple modifications could significantly improve the performance of the XMIS. The total cost of components for an XMIS field demonstration system that includes these modifications is about $60 K and includes about $24 K for the x-ray generator and about $16 K for the specially-made detector assemblies. Further field-testing of the XMIS needs to be performed, but this should be done following implementation of the indicated modifications. With the modifications, high resolution scanning of a 0.5 m x 0.5 m area can be done in 20 to 30 seconds at a power level of 300 to 400 watts.
引用
收藏
页码:34 / 44
页数:11
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