Si delta doping inside InAs/GaAs quantum dots with different doping densities

被引:9
|
作者
Wang, Ke-Fan [1 ,2 ]
Gu, Yongxian [1 ]
Yang, Xiaoguang [1 ]
Yang, Tao [1 ]
Wang, Zhanguo [1 ]
机构
[1] Chinese Acad Sci, Inst Semicond, Key Lab Semicond Mat Sci, Beijing 100083, Peoples R China
[2] Henan Univ, Sch Phys & Elect, Henan Key Lab Photovolta Mat, Kaifeng 475004, Peoples R China
来源
基金
中国博士后科学基金; 美国国家科学基金会;
关键词
OPTICAL-PROPERTIES; INAS; PHOTOLUMINESCENCE;
D O I
10.1116/1.4732462
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
During the growth process of InAs/GaAs self-assembled quantum dots (QDs), Si delta doping with different doping densities was carried out during initial QD formation. Atomic force microscopy (AFM) reveals that this Si doping affects the QD morphology only slightly. Conductive AFM measurements show that the current on the surface QDs increases at low doping densities, but decreases unexpectedly at high doping densities. Temperature-dependent photoluminescence (PL) measurements show that an optimized Si doping density (5 x 10(11) cm(-2)) improves the PL thermal stability for an intermediate temperature range from 125 to 225 K and enhances the PL intensity up to 35 times at room temperature. These results indicate that the Si doping density plays a key role in the electrical and optical properties of InAs QDs. (C) 2012 American Vacuum Society. [http://dx.doi.org/10.1116/1.4732462]
引用
收藏
页数:6
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