Effect of front and back contact roughness on optical properties of single junction a-Si:H solar cells

被引:3
|
作者
Zeman, M
Van Swaaij, RACMM
Zuiddam, M
Metselaar, JW
Schropp, REI
机构
[1] Delft Univ Technol, DIMES, Lab Elect Components Technol & Mat, NL-2600 GB Delft, Netherlands
[2] Univ Utrecht, Debye Inst, Dept Atom & Interface Phys, NL-3508 TA Utrecht, Netherlands
关键词
interface roughness; light scattering; single junction a-Si : H solar cells;
D O I
10.1016/S0927-0248(00)00194-X
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
Using computer modeling, we investigated the effect of interface roughness on the optical properties of a single junction a-Si:H solar cell by varying the root mean square roughness of the rough interfaces. The effect of the contact roughness on the external quantum efficiency, QE, of the solar cell in different parts of the light spectrum was determined. The choice of the back contact strongly influences the QE and the absorption in the non-active layers for the wavelengths above 650 nm. The effect of increasing the roughness of the contact interfaces was investigated for both the superstrate and substrate type cell. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:353 / 359
页数:7
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